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TechWorks

NMI Manufacturing Network: "DfT in Changing Markets"

Start date/time :  12/5/2016 - 9am
End date/time :  12/5/2016 - 4pm
Venue :  Hauser Forum, 3 Charles Babbage Road, Cambridge, CB3 0FT
Organiser name :  Patrick McNamee
Organiser email :  patrick.mcnamee@nmi.org.uk

This event will examine the challenges of test development efficiency in manufacturing. and aims to discuss some of the new approaches and techniques which can be adopted in Product Design and Development and to ease the challenges of DfT in the future.

This event will examine the challenges of test development efficiency in manufacturing. and aims to discuss some of the new approaches and techniques which can be adopted in Product Design and Development and to ease the challenges of DfT in the future.

After a dramatic year of merger and acquisition in the semiconductor industry, it is clear that the industry is changing rapidly and that some of the main growth drivers of the last decade are slowing dramatically. No longer can you trust that Moore’s Law will bring you the cost reduction path you have become used to or that consumers will buy a new smartphone every year which is only an incremental improvement on what they have.

So what are the next growth industries and what new testing challenges do they bring if any?

dft-hauser Reading almost any article you care to read now talks about the IoT and the Smart or Connected Car what does that mean for the kind of devices that will be made and how they will be tested on the one hand you have to have extreme volume at low cost and on the other you will have devices that are safety critical.

Draft Agenda

09:00 Registration

09:30 Welcome and Introduction “DfT in Millimeter Wave Testing” – Ronald Burke, Teradyne Inc. “A Method for Yield Debug on New Chips” – Christophe Suzor, Synopsys “Six bands, Seven radios and Eight standards – you want to test it – – – How Fast?!!” – Tim Masson, Keysight Technologies “Using Test Access standards across the product Lifecycle” – Andrew Richardson, Lancaster University “DfT for Automotives and Giga-Gate Designs” – Kurian Varghese, Mentor Graphics “Using Distributed Test on ATE to Increase Throughput and Lower COT at Final Test” – Mike Bergler, Xcerra “DFT and Production in IoT Devices” – Paul Freeman, PF Consulting “Testing Beyond the Tester Capability” – Paul van Ulsen, Salland Engineering “The NMI’s Product Realisation Initiative” – Paul Freeman, PF Consulting

16:00 Event Close

Thank you to our sponsors and exhibitors: Synopsys Exception EMS Mentor Graphics Microlease RoodMicrotec Salland Engineering Sponsorship Opportunities For sponsorship opportunities, please contact Patrick McNamee.

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Organisation:  TechWorks